UCRF Electron Microscopy group

UCRF 전자현미경 그룹

관련기사 바로가기

투과전자현미경은 일차원 나노와이어, 이차원 필름, 삼차원 벌크 등 나노스케일 물질들의 결정구조 및 화학적 결합상태를 밝히는데 필수적인 분석방법이다. 우리 연구그룹은 구면수차가 보정된 최첨단의 투과전자현미경들을 이용하여 다양한 나노 물질들의 기초현상들을 관찰하는 연구를 수행하고 있다.
Transmission electron microscopy (TEM) is vital for unveiling the crystal structure and chemical states of nanoscale materials such as 1 dimensional(D) nanowires, 2D thin layers, and 3D bulk materials. Our group at UCRT is performing active research about revealing fundamental nature of various nanomaterials using a spherical aberration corrected TEM.

Major research field

Transmission Electron Microscopy, Interface analysis, Insitu analysis, Resistive switching memory, 2D TMD

Desired field of research

반도체 소자 종합 분석, 빛 물질 상호작용 이해

Research Keywords and Topics

Insitu heating & biasing TEM experiment using specialized holder
· Revealing the resistive switching mechanism of 2D thin films-based ReRAM
· Characterization of oxygen vacancies in layered-perovskites for Solid Oxide Fuel Cell
· Interface analysis between 2D materials and metals using Focused Ion Beam (FIB) and Cs-corrected (S)TEM technique
· Characterization of interesting phenomena which occur by light-materials interaction
· Structural and chemical analysis of various catalysts for future energy application

Research Publications
MORE

· Jieun Yang, Abdul Rahman Mohmad, Yan Wang, Raymond Fullon, Xiuju Song, Fang Zhao, Ibrahim Bozkurt, Mathias Augustin, Elton J. G. Santos, Hyeon Suk Shin, Wenjing Zhang, Damien Voiry, Hu Young Jeong* and Manish Chhowalla*, “Ultrahigh-current-density niobium disulfide catalysts for hydrogen evolution”, Nat. Mater. 18, 1309 (2019)
· Javeed Mahmood, Feng Li, Sun-Min Jung, Mahmut Sait Okyay, Ishfaq Ahmad, Seok-Jin Kim, Noejung Park*, Hu Young Jeong*, and Jong-Beom Baek*, “An efficient and pH-universal ruthenium-based catalyst for the hydrogen evolution reaction”, Nat. Nanotech. 12, 441-447 (2017)
· Insung Choi, Hu Young Jeong (equally contributed), Hyeyoung Shin, Gyeongwon Kang, Myunghwan Byun, Hyungjun Kim, Adrian M. Chitu, James S. Im, Rodney S. Ruoff, Sung-Yool Choi*, and Keon Jae Lee*, “Laer-induced phase separation of silicon carbide”, Nat. Commun. 7, 13562 (2016)

Patents

· Quantum dot with metastable phase and manufacturing method for the same, keonjae Lee, Duk Young Jeon, Hu Young Jeong, Tae Hong Im, Chulhee Lee, 등록번호 US20200190403A1 (2020. 06, 18)
· 이원소성 화합물의 상분리 현상을 이용한 실리신 제조방법, 이에 의하여 제조된 실리신, 최성율, 이건재, 최인성, 정후영, 등록번호 10-1685149 (2016. 12. 05)

국가과학기술표준분류

  • EB. 재료
  • EB07. 분석·물성평가기술
  • EB0702. 재료구조/조직 분석기술

국가기술지도분류

  • 기반주력산업 가치창출
  • 041600. 나노 소재/소자기술

녹색기술분류

  • 고효율화기술
  • 전력효율성 향상
  • 324. 전력 IT기술

6T분류

  • IT 분야
  • 핵심부품
  • 010112. 집적회로기술